High-throughput, GPU-accelerated multislice electron ptychography for atomic-resolution imaging beyond the conventional depth and thickness limits.
CUDA-optimized multislice propagation achieving 100× speedup over CPU baselines. Handle large-scale 4D-STEM datasets (512×512×64×64) in minutes, not hours.
A100 / H100 / RTX Pro 6000 ReadyProprietary multi-slice algorithms reconstruct thick specimens (>100 nm) with atomic precision—unreachable by conventional SSB/Wigner distribution methods. Ideal for bulk interfaces and 3D-IC TSV structures.
3D-IC / GAA / CFET CompatibleBuilt-in probe aberration correction (C1, C3, C5), scan distortion rectification, and tilt-axis refinement—ensuring quantitative accuracy for every reconstruction, with traceable calibration metadata in every output.
Quantitative & TraceableSeamless data pipeline from JEOL ARM / Thermo Fisher Spectra / Nion HERMES. Automated batch processing, metadata preservation, and LIMS-compatible JSON/XML reporting for FA labs.
LIMS-Compatible ReportingMEP reconstruction requires pixelated detectors and aberration-corrected STEM platforms. Our software natively supports the leading 4D-STEM hardware ecosystem.
Cold-FEG double Cs-corrected STEM with sub-Å probe and highest stability for atomic-resolution 4D-STEM ptychography.
X-FEG / X-CFEG monochromated platforms with X lens corrector. Excellent for low-dose ptychography and EELS-correlated 4D-STEM.
Ultra-high vacuum cold-field emission STEM with Nion-designed quadrupole-octupole correctors. Best-in-class probe coherence for ptychography.
Dedicated STEM platforms with probe aberration correction and high-tilt capability. Cost-effective entry point for 4D-STEM ptychography.
Legacy but widely deployed platforms. With pixelated detector retrofit and probe corrector upgrade, capable of high-quality 4D-STEM ptychography.
Custom-built 4D-STEM setups using open-source scan controllers (e.g., TEM Extensibility Interface) and home-built pixelated detectors. We provide SDK integration support.
128×128 pixel array, 1M fps, 24-bit dynamic range. The gold standard for 4D-STEM ptychography.
Event-driven readout, zero noise, 55 µm pixel pitch. Timepix3 adds TOF capability for energy-resolved 4D-STEM.
Medipix3 ASIC-based, 1.2M fps burst mode, radiation hard. Widely used in materials science 4D-STEM.
512×512 direct electron detector, 4,000 fps, optimized for 4D-STEM diffraction pattern capture at high speed.
Direct detection electron counting. K3 IS supports in-situ 4D-STEM with high DQE and large field of view.
Large-format direct detection, 64 MP, optimized for low-dose diffraction and large momentum transfer capture.
Split pn-junction CCD, 1,000 fps, radiation tolerant. Excellent for high-energy electron diffraction (MeV range).
Hybrid pixel detector with adaptive gain. Optimized for simultaneous EELS and 4D-STEM acquisition.
Hybrid-pixel electron-counting detector purpose-built for 4D-STEM. Up to 120 kfps with noise-free readout and high dynamic range — ideal for ptychography with dwell times below 10 µs.
Our technology stack combines cutting-edge algorithms with high-performance computing to deliver results you can trust.
Our forward model treats the specimen as a stack of thin slices and explicitly propagates the probe through it, capturing multiple (dynamical) scattering instead of assuming it away. Mixed-state probe modes absorb partial coherence; joint position refinement corrects scan errors during iteration.
Why it matters: SSB / WDD / single-slice methods assume single scattering — they break down beyond 20–30 nm. Multislice keeps atomic precision past 100 nm and enables depth sectioning.Reconstruction is built GPU-first: batched FFTs, fused CUDA kernels, and mixed-precision arithmetic keep the propagation loop on-device end to end. Multi-GPU domain decomposition scales near-linearly for large fields of view.
Why it matters: a typical 256×256-scan dataset reconstructs in minutes on a single A100 — ~100× faster than CPU codes. Iterate on parameters the same day, not next week.Probe aberrations (C1 / C3 / C5), scan distortion, detector response, and specimen tilt are refined jointly with the reconstruction rather than assumed from nominal values — every output carries traceable calibration metadata.
Why it matters: this is what turns a pretty picture into measurement — sub-picometer column statistics, strain tensors, and polarization maps you can defend in a paper or an FA report.